Technical Archives
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Employing MDI testing with 10Gbase-T PHY
(23/02/10)
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How to make GUI tests repeatable (11/02/10)
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Investigating image processing with functional testing (29/09/09)
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3D EM simulation assists dynamic system analysis (23/09/09)
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A beginner's guide to configuring counter/timer (31/08/09)
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Save time in measurements using low-cost oscilloscopes (12/08/09)
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Finding bugs in embedded C software (11/08/09)
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The need for software component testing (29/07/09)
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Developing a comprehensive test, support plan (24/07/09)
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Probe, calibrate for accurate BBIQ measurements (30/06/09)
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Capture, debug system crashes (22/06/09)
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Optimising ECU parameters with XCP (10/06/09)
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Spot defects in safety-critical code (28/05/09)
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Understand JTAG's role in system debug (26/05/09)
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Find defects in software with RBT (21/05/09)
Application Notes
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Propagation delay measurements using TDR (time-domain reflectometry) (03/03/10)
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Accelerated Neutron SER testing and calculation of terrestrial failure rates (25/02/10)
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Self test with PSoC (10/02/10)
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Understanding H.264 decoder buffer mechanism for TMS320DM365 (02/02/10)
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Advanced debugging using the enhanced emulation module (EEM) (27/01/10)
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Simulation debugging using triple speed Ethernet testbench (18/12/09)
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W-CDMA BER test on picoChip femtocell reference design using the Agilent N5182A MXG vector signal generator (26/11/09)
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Agilent interactive functional test software: battery current drain solution for cellular devices (25/11/09)
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Agilent radar measurements (24/11/09)
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Using multiple boundary scan port linker (BSCAN2) (28/10/09)
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How to calibrate the MAX9979 pin electronics (07/10/09)
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Reference design for a PC-based oscilloscope (02/10/09)
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Inexpensive (almost free) probe/tweezers for testing SMD components (28/09/09)
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Robust contact monitor simplifies design of body control computers (06/08/09)
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PMU mode operation for the MAX9979 pin-electronics IC (05/08/09)
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